Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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- | Less surface roughness scattering effects in highly doped Si-channel and ambipolar conduction behavior with Schottky-barrier contacts | Dae-Young Jeon; So Jeong Park; Gyu-Tae Kim; Gerard Ghibaudo; Sebastian Pregl; Thomas Mikolajick; Walter M. Weber |