Jang Ho Won 이종람 2024-01-12T22:37:02Z 2024-01-12T22:37:02Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/98534 English On the origin of annealing-induced degradation in Al-based ohmic contacts to N-Face n-GaN Conference 1 International Conference on Electronic Materials and Nanotechnology for Green Environment 2010 International Conference on Electronic Materials and Nanotechnology for Green Environment 2010 KO