Jun-Woo Park Hosun Lee Tae Dong Kang Andrei Sirenko Lee Hyun Seok Lee Suyoun Jeung-hyun Jeong CHEONG, BYUNG KI 2024-01-12T23:06:26Z 2024-01-12T23:06:26Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/99069 English Spectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin Films Conference 1 Material Research Society Material Research Society US