Wu Zhe Park Young Wook Hyung-Woo Ahn Lee Suyoun Jeung-hyun Jeong Jeong, Doo Seok Kwangsoo No CHEONG, BYUNG KI 2024-01-12T23:06:28Z 2024-01-12T23:06:28Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/99071 English Improved Temperature Dependence of Phase Change Memory Device Using Ge-doped SbTe Conference 1 Material Research Society Material Research Society US