LIM, WEON CHEOL Lee Ji-hye LEE, YEON HEE 2024-01-12T23:35:15Z 2024-01-12T23:35:15Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/99555 English CIGS solar quantitative depth profile dynamic SIMS Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry Conference 1 5th International Symposium on Practical Surface Analysis, pp.203 5th International Symposium on Practical Surface Analysis 203 203 JA