Jeong, Doo Seok Lee Suyoun Jeung-hyun Jeong CHEONG, BYUNG KI Cheol Seong Hwang 2024-01-13T02:01:02Z 2024-01-13T02:01:02Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/101158 English chalcogenice x-ray photoelectron spectroscopy interfacial dipole layer Ge2Sb2Te5 Characterization of interface between amorphous Ge2Sb2Te5 and TiN by x-ray photoelectron spectroscopy Conference 1 European|Phase Change and Ovonics Symposium 2009, pp.176 - 180 European|Phase Change and Ovonics Symposium 2009 176 180 GW