Min-Ho Kwon Bong-Sub Lee Stephanie N. Bogle John R. Abelson Stephen G. Bishop Simone Raoux Heng Li P. Craig Taylor 2024-01-13T07:03:16Z 2024-01-13T07:03:16Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/103992 English Ge2Sb2Te5 medium range order fluctuation electron microscopy Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy Conference 1 MRS 2006 spring meeting MRS 2006 spring meeting US