Dae-Hwan Kang Kim Inho Jeung-hyun Jeong CHEONG, BYUNG KI Dong-Ho Ahn Dongbok Lee Hyun-Mi Kim Ki-Bum Kim 2024-01-13T07:03:22Z 2024-01-13T07:03:22Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/103999 English phase change memory switching reliability oxidized TiN TiN electrode Investigation on the enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrode Conference 1 MRS 2006 spring meeting MRS 2006 spring meeting US