Kim, Young Hwan Kim Dong Soo Jung, Sung Mok Kim, Seong Il Kim, Yong Tae 2024-01-13T07:31:30Z 2024-01-13T07:31:30Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/104125 English memory oxide Effect of Oxygen Stoichiometry on Resistive Switching Characteristics of Pr0.7Ca0.3MnO3 Thin Films Grown by Pulsed Laser Deposition Conference 1 Materials Research Society 2006 spring meeting Materials Research Society 2006 spring meeting US