Kim, Yong Tae SHIM, SUN IL Kim, Young Hwan Kim, Seong Il 2024-01-13T08:33:37Z 2024-01-13T08:33:37Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/104803 English FeRAM memory Ferroelectric MFMISFET Fabrication and Characteristics of Metal-Ferroelectric-Metal-Insulator-Semiconductor field-effect transistor Conference 1 The International Conference on Electrical Engineering 2005 (ICEE2005) The International Conference on Electrical Engineering 2005 (ICEE2005) CC