Jung Ji-Hyun 조유선 Kim, Se Yun 2024-01-13T09:04:04Z 2024-01-13T09:04:04Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105086 English 프로브 유전율 PCB null null probe permittivity PCB Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe Conference 1 Korea-Japan Joint Conference on AP/EMC/EMT, pp.155 - 158 Korea-Japan Joint Conference on AP/EMC/EMT 155 158 KO