Kim, Yong Tae KIM IK SOO Kim, Seong Il Dong Chul Yoo In-Hoon Choi 2024-01-13T10:03:14Z 2024-01-13T10:03:14Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105563 English Identification of hydrogen-induced changes in atomic deformation of ferroelectric SrBi2Nb2O9 thin film using transmission electron microscopy Conference 1 International Conference on Electroceramics International Conference on Electroceramics FR