Kim, Yong Tae SHIN, SUN IL Jung Ho Park Kim, Seong Il Kwon Young Suk 2024-01-13T10:03:14Z 2024-01-13T10:03:14Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105564 English Characteristics of Single Transistor type Ferroelectric Memory Using Pt/SrBi2Ta2O9/Si and Pt/SrBi2Ta2O9/Y2O3/Si Gate Structure Conference 1 International Conference on Electroceramics International Conference on Electroceramics FR