KIM IK SOO Young Mi Kim Kim, Yong Tae Kim, Seong Il In-Hoon Choi 2024-01-13T10:03:17Z 2024-01-13T10:03:17Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105567 English Enhancement of ferroelectric properties of SrBi2Nb2O9 thin films by oxygen plasma rapid thermal annealing Conference 2 The 11th Korean Conference on Semiconductors, v.2, pp.447 - 448 The 11th Korean Conference on Semiconductors 2 447 448 KO