Kim, Seong Il Kim, Yong Tae Kim, Young Hwan SHIN, SUN IL Jung Ho Park 2024-01-13T10:03:20Z 2024-01-13T10:03:20Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105570 English Circuit Design and Full Chip Simulation for Single Transistor Type Ferroelectric Random Access Memory Conference 1 International Conference on Electrical Engineering 2004, v.1, pp.325 - 328 International Conference on Electrical Engineering 2004 1 325 328 JA