Lee, Jung Il Han, Il Ki Sookyung Chang Eunkyu Kim 2024-01-13T11:00:59Z 2024-01-13T11:00:59Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105953 English low frequency noise poly-Si resistors thermal activation tunneling random walk of electrons thermionic emission New model for low frequency noise in poly-Si resistors Conference 2 International Women's Conference on BIEN Technology, pp.408 - 409 International Women's Conference on BIEN Technology 408 409 KO