Dong Myong Kim Lee, Jung Il Hwe-Jong Kim 2024-01-13T11:01:28Z 2024-01-13T11:01:28Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105986 English Photo-response Gate leakage High-electron mobility transistors Sub-bandgap photonic characterization of the gate leakage in pseudomorphic high-electron mobility transistors Conference 2 The First International Symposium on Future Issues in Nano-optoelectronics, pp.40 - 41 The First International Symposium on Future Issues in Nano-optoelectronics 40 41 KO