Han, Il Ki Choi, Won Jun Park, Young Ju Cho, Woon Jo Lee, Jung Il Myoung-Bok Lee Alain Chovet Jean Brini Gerard Ghibaudo 2024-01-13T11:01:31Z 2024-01-13T11:01:31Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/105989 English Low frequency noise Polycrystalline-Si thin films Resistors Transistors Thermal activation Physical model for low frequency noise in poly-Si resistors and thin-film transistors Conference 2 The First International Symposium on Future Issues in Nano-optoelectronics, pp.32 - 33 The First International Symposium on Future Issues in Nano-optoelectronics 32 33 KO