Baik Young Joon 채기웅 Lee Wook Seong 2024-01-13T12:31:45Z 2024-01-13T12:31:45Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/106800 English Characterization of 5-inch free-standing diamond wafers deposited by single-cathode DCPACVD. Conference 1 Proc. the 8th International Conference New Diamond Science and Technology 2002 Proc. the 8th International Conference New Diamond Science and Technology 2002 AT