김한기 0 전은정 Cho Won Il Yoon Young Soo 2024-01-13T13:32:55Z 2024-01-13T13:32:55Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/107406 English Transmission electron microscopy (TEM) study of the degradation mechanism of amorphous vanadium oxide based thin film battery Conference 1 2001 Joint International Meeting Abstract (Journal of the Electrochemical Society), v.148, no.4, pp.#37 2001 Joint International Meeting Abstract (Journal of the Electrochemical Society) 148 4 #37 #37 US