PARK HYUN MEE KIM YOUNG MAN Ryu Jae Chun Cheong Chan Seong 이대운 LEE KANG BONG 2024-01-13T13:34:05Z 2024-01-13T13:34:05Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/107483 English Evaluation of origin for trace organic contaminants adsorbing on the surface of silicon wafers in manufacturing line by home-built thermal desorption and P&T GC-MS Conference 1 2001 Asianalyisis VI Conference Abstract 2001 Asianalyisis VI Conference Abstract JA