Kim Yong Tae Kim Seong Il 최훈상 KIM CHUN KEUN 이창우 2024-01-13T14:01:11Z 2024-01-13T14:01:11Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/107565 English SBN Effects of Bi content on electrical properties of Pt/SrBi//2Nb//2O//9/Si ferroelectric gate structure Conference 2 2001 Korea-japan Joint Workshop on Advanced Semiconductor Process and Equipment, pp.9 - 12 2001 Korea-japan Joint Workshop on Advanced Semiconductor Process and Equipment 9 12 KO