Sung-Kyun Lee 최인훈 이철의 Kim Yong Tae KIM CHUN KEUN 2024-01-13T14:01:18Z 2024-01-13T14:01:18Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/107573 English ferroelectric gate structure Correlation between charge injection and memory window in the ferroelectric gate stack structures Conference 2 2001 Korea-japan Joint Workshop on Advanced Semiconductor Process and Equipment, pp.13 - 15 2001 Korea-japan Joint Workshop on Advanced Semiconductor Process and Equipment 13 15 KO