이승호 KIM HEO JEN Seong Il Kim 조중열 Y. Nishihara Park Young Ju 2024-01-13T14:31:51Z 2024-01-13T14:31:51Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/107876 English hydrogenation defect Lifetime control by low energy electron irradiation and hydrogen annealing Conference 2 the 8th Kor. Conf. on Semicon., pp.543 - 544 the 8th Kor. Conf. on Semicon. 543 544 KO