Kim Yong Tae Kim Seong Il 최인훈 최훈상 이창우 2024-01-13T15:00:33Z 2024-01-13T15:00:33Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/108052 English NDRO-FRAM EL-MoM5 effects of Bi/Sr stoichiometric ratio on electrical properties of Pt/SrBi2Nb2O9/Si ferroelectric gate structure Conference 1 2001 AVS 48th International Symposium, pp.7 2001 AVS 48th International Symposium 7 7 US