Kim Yong Tae PARK YOUNG KYUN 장호정 김희준 Akira Yoshida 2024-01-13T15:31:22Z 2024-01-13T15:31:22Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/108361 English YMnO₃ Effects of Y to Mn ratio on memory window in the YMnO₃ ferroelectic gate Conference 1 The International Conference on Electrical Engineering 2000, pp.66 - 69 The International Conference on Electrical Engineering 2000 66 69 JA