LEE KYEONG SEOK 백성기 2024-01-13T16:00:53Z 2024-01-13T16:00:53Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/108612 English microstructure characterization synchrotron x-ray diffraction epitaxial PZT thin films Characterization of domain structures in epitaxial PZT thin films using synchrotron XRD Conference 1 The 12th International Symposium on Integrated Ferroelectrics The 12th International Symposium on Integrated Ferroelectrics GW