J. S. Park S. Lee Ju Byeong Kwon OH MYUNG HWAN J. Jang D. Jeon 2024-01-13T17:02:13Z 2024-01-13T17:02:13Z 2021-09-29 0099-0966 https://pubs.kist.re.kr/handle/201004/109227 English FED FEA MEMS Improvement of field-emission properties by formation of Nb-silicide layer on silicon-tip FEAs Conference 1 SID 99 Digest, pp.576 - 579 SID 99 Digest 576 579 US