Ju Byeong Kwon SHIN KYEONG SIK OH MYUNG HWAN LEE YUN HI 2024-01-13T17:32:16Z 2024-01-13T17:32:16Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/109498 English ELD Interfacial barrier for the electronic conduction in SrS:Cu, Cl Thin films Conference 1 IC-STDP'1999 IC-STDP'1999 US