LEE YEON HEE HAN SEUNG HEE 윤정현 KIM YOUNG MAN 손성건 박성우 2024-01-13T18:03:24Z 2024-01-13T18:03:24Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/109831 English paint TOF-SIMS forensic depth profile Identification of automotive paints using time-of-flight secondary ion mass spectrometry Conference 1 AA6, pp.80 AA6 80 80 BE