HAN JUN HYUN SHIN MYUNG CHUL S.H. Kang 2024-01-13T18:31:13Z 2024-01-13T18:31:13Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/109970 English electromigration Current Density Exponent Black Equation The effect of grain structure on the current-density exponent in the black equation for Al-based interconnects Conference 2 The 4th International conference on Electronic Materials, 제주 , 한국 , 8 월 24 ∼ 27 일 (1998), pp.68 The 4th International conference on Electronic Materials, 제주 , 한국 , 8 월 24 ∼ 27 일 (1998) 68 68 KO