LEE KYEONG SEOK 백성기 2024-01-13T18:31:13Z 2024-01-13T18:31:13Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/109971 English domain structure PZT strain relaxation x-ray diffraction Structural characterization of epitaxial PLZT thin films Conference 1 Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998., pp.1 - 9 Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998. 1 9 JA