KIM YOUNG SIK LEE YUN HI Ju Byeong Kwon OH MYUNG HWAN 성만영 신동기 2024-01-13T18:33:52Z 2024-01-13T18:33:52Z 2021-09-29 0098-0966 https://pubs.kist.re.kr/handle/201004/110133 English electroluminescent display(ELD) An improved understanding of the relationship between interface roughness of ZnS:Pr,Ce phosphor-Ta//2O//5 insulating film and electrical characteristics of TFEL devices Conference 1 Proc. SID '98, pp.659 - 662 Proc. SID '98 659 662 US