고의관 C.S. Park 박일우 Park Young Ju KIM EUN KYU 조성호 2024-01-13T19:02:10Z 2024-01-13T19:02:10Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/110292 English GaN Study of crystallographical defects of the GaN micro-crystals by Raman spectroscopy and X-ray diffraction Conference 2 The 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998, pp.125 - 126 The 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998 125 126 KO