OH MYUNG HWAN K. C. Park J. H. Moon S. J. Chung W. Milne J. Jang 2024-01-13T21:02:32Z 2024-01-13T21:02:32Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/111369 English field emission display Relationship between field emission characteristics and hydrogen content in DLC deposited by layer-by-layer technique using PECVD. Conference 1 Technical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia., pp.268 - 272 Technical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia. 268 272 KO