임동섭 Byun Dongjin Kim Gyeung Ho Nam Ok-Hyun 최인훈 Park Dal keun Kum Dong Wha 2024-01-13T21:04:19Z 2024-01-13T21:04:19Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/111476 English GaN Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD Conference 1 Materials research society symposium proceedings,, v.v. 423, pp.451 - 456 Materials research society symposium proceedings, v. 423 451 456 US