LEE YEON HEE HAN SEUNG HEE Lee junghye 윤정현 2024-01-13T21:33:17Z 2024-01-13T21:33:17Z 2021-09-29 https://pubs.kist.re.kr/handle/201004/111698 English TOF-SIMS Plasma ion implantation Multilayer Characterization of solid surfaces using time-of-flight secondary ion mass spectrometry. Conference 1 Fifth Eurasia Conference on Chemical Sciences, pp.31 Fifth Eurasia Conference on Chemical Sciences 31 31 CC