Kim, Yosep Kim, Yong-Su Lee, Sang-Yun Cho, Young-Wook Moon, Sung Kim, Yoon-Ho Han, Sang-Wook 2024-01-19T10:39:05Z 2024-01-19T10:39:05Z 2022-02-28 2018-05 2160-9020 https://pubs.kist.re.kr/handle/201004/114369 We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value. English IEEE Direct quantum process tomography via measuring sequential weak values Conference 1 Conference on Lasers and Electro-Optics (CLEO) Conference on Lasers and Electro-Optics (CLEO) US San Jose, CA 2018-05-13 2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) 000526031000167