Choi, J.W. Seo, J.H. Hwang, C. Cho, B.I. Lee, D.R. Chang, Y.J. 2024-01-19T13:33:29Z 2024-01-19T13:33:29Z 2022-01-10 2021-10 1567-1739 https://pubs.kist.re.kr/handle/201004/116305 [No abstract available] English Elsevier B.V. Advanced materials characterization using synchrotron radiation Article 10.1016/j.cap.2021.07.005 1 Current Applied Physics, v.30, pp.1 - 3 Current Applied Physics 30 1 3 scie scopus kci 000735613300001 2-s2.0-85110463625 Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Editorial Material Angle-resolved photoemission spectroscopy (ARPES) Synchrotron light sources X-ray absorption spectroscopy (XAS) X-ray diffraction (XRD) X-ray magnetic circular dichroism (XMCD) X-ray photoelectron spectroscopy (XPS)