Oh, JH Lee, YH Ju, BK Park, CY Shin, DK Oh, MH 2024-01-19T17:39:26Z 2024-01-19T17:39:26Z 2022-03-07 1997 https://pubs.kist.re.kr/handle/201004/118773 The dielectric reliability of the multilayered BaTiO3 thin films with different thickness was studied by TZDB and TDDB techniques. The surface roughness and the composition of the thin films were investigated by AFM and AES. The results indicate that TZDB behavior is related to tile roughness of the surface of the multilayered BaTiO3 thin films and TDDB characteristics as well as the quantity of the leakage current may be explained in terms of the formation and thickness of the transition region. English I E E E Effects of the thickness on the dielectric reliability of multilayered BaTiO3 insulating layer Conference 1 5th International Conference on Properties and Applications of Dielectric Materials, pp.1026 - 1029 5th International Conference on Properties and Applications of Dielectric Materials 1026 1029 US SEOUL, SOUTH KOREA 1997-05-25 PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2 A1997BJ48U00256 2-s2.0-0030706898 Proceedings Paper