Bae, Kiho Jang, Dong Young Park, Joong Sun Son, Ji-Won Prinz, Fritz B. Shim, Joon Hyung 2024-01-19T18:02:21Z 2024-01-19T18:02:21Z 2021-09-05 2020-03 2288-6206 https://pubs.kist.re.kr/handle/201004/118891 Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in O-18(2) environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF-SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ. English KOREAN SOC PRECISION ENG YTTRIA-STABILIZED ZIRCONIA ACTIVATION-ENERGY SINGLE-CRYSTAL OXYGEN CONDUCTIVITY TRANSPORT SURFACE SUPERLATTICES INTERFACES Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry Article 10.1007/s40684-019-00169-3 1 INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY, v.7, no.2, pp.405 - 410 INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY 7 2 405 410 scie scopus kci ART002559858 000499571800001 2-s2.0-85075795266 Green & Sustainable Science & Technology Engineering, Manufacturing Engineering, Mechanical Science & Technology - Other Topics Engineering Article YTTRIA-STABILIZED ZIRCONIA ACTIVATION-ENERGY SINGLE-CRYSTAL OXYGEN CONDUCTIVITY TRANSPORT SURFACE SUPERLATTICES INTERFACES Ion diffusion Surface exchange Isotope tracer Stain effect Heterostructure Yttria-stabilized zirconia