Jhon, YM Kim, DH Chu, H Lee, CW Choi, SS 2024-01-19T18:08:39Z 2024-01-19T18:08:39Z 2022-03-07 1995 0272-9172 https://pubs.kist.re.kr/handle/201004/119054 English MATERIALS RESEARCH SOC Characteristics of excimer-laser-crystallized polysilicon films by line beam scanning method Conference 1 Symposium on Beam-Solid Interactions for Materials Synthesis and Characterization, at the 1994 MRS Fall Meeting, v.354, pp.647 - 652 Symposium on Beam-Solid Interactions for Materials Synthesis and Characterization, at the 1994 MRS Fall Meeting 354 647 652 US BOSTON, MA 1994-11-28 BEAM-SOLID INTERACTIONS FOR MATERIALS SYNTHESIS AND CHARACTERIZATION A1995BE68S00096 2-s2.0-0029547468 Proceedings Paper