Han, Jeong-Heon Yoo, Nak-Won Kang, Ji-Hoon Ju, Byeong-Kwon Park, Min-Chul 2024-01-19T19:30:40Z 2024-01-19T19:30:40Z 2021-09-05 2019-09 0091-3286 https://pubs.kist.re.kr/handle/201004/119629 Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related to the optical sectioning strength and can rapidly acquire three-dimensional data. The optimization of SIM with an SLM is proposed. Previous studies primarily varied magnification with a high numerical aperture objective to optimize the axial response. It is feasible to obtain the maximum optical sectioning strength by designing a grid pattern that has an appropriately high spatial frequency and to uniformly cover the entire frequency spectrum of the sample by rotating a grid pattern. We have successfully optimized SIM with such a grid and covered the frequency spectrum by rotating a grid pattern in multiple orientations. (C) The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. English SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS LIVE CELLS Optimization of structured illumination microscopy with designing and rotating a grid pattern using a spatial light modulator Article 10.1117/1.OE.58.9.094102 1 OPTICAL ENGINEERING, v.58, no.9 OPTICAL ENGINEERING 58 9 scie scopus 000489032700021 2-s2.0-85072402245 Optics Optics Article LIVE CELLS structured illumination microscopy optimization optical sectioning spatial light modulator three-dimensional measurement