Han, Jeong-Heon Yoo, Nak-Won Kim, Myung-Ha Ju, Byeong-Kwon Park, Min-Chul 2024-01-19T19:31:47Z 2024-01-19T19:31:47Z 2021-09-02 2019-08-01 1559-128X https://pubs.kist.re.kr/handle/201004/119692 We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency. (C) 2019 Optical Society of America. English OPTICAL SOC AMER STRUCTURED-LIGHT MICROSCOPY INSPECTION SPEED CELLS Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform Article 10.1364/AO.58.005883 1 APPLIED OPTICS, v.58, no.22, pp.5883 - 5891 APPLIED OPTICS 58 22 5883 5891 scie scopus 000478073200008 2-s2.0-85072014573 Optics Optics Article STRUCTURED-LIGHT MICROSCOPY INSPECTION SPEED CELLS