Bae, Jee Hwan Kim, Tae Kyoung Kim, Hyeon Min Hong, Jae-Young Kim, Ji-Young Cho, Min Kyung Kim, Gyeung Ho Ha, Heon-Young Chun, Dong Won 2024-01-19T19:32:14Z 2024-01-19T19:32:14Z 2021-09-02 2019-08 0018-9464 https://pubs.kist.re.kr/handle/201004/119716 The effect of the thicknesses of the Pt intermediate layer and FePt magnetic layer in CrV/ Pt/ FePt multilayers on the microstructure and magnetic properties for the perpendicular magnetic anisotropy was investigated. The Pt (0-4 nm) and FePt (7-28 nm) layers were deposited on a 90 nm-thick Cr94V6 underlayer at 350 degrees C, and the crystal structure and magnetic properties of the fabricated CrV/ Pt/ FePt multilayers were characterized. X-ray diffraction and vibrating sample magnetometer measurements revealed that the out-of-plane coercivity (Hc-out) and squareness increase when the Pt intermediate layer is deposited between CrV and FePt because it protects against diffusion of Cr and V atoms into the FePt magnetic layer during deposition. In addition, we confirmed that Hc-out and squareness decrease with increasing FePt layer thickness in the range of 7-28 nm. As a result, the maximum Hc-out, S, and squareness were obtained for a multilayer with a CrV thickness of 90 nm, Pt thickness of 2 nm, and FePt thickness of 7 nm. This paper shows that highly ordered FePt L1(0) (001) can be fabricated by sublayer thickness control. English IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC Effect of Pt and FePt Layer Thickness on Microstructure and Magnetic Properties of L1(0) FePt Films With Perpendicular Anisotropy Article 10.1109/TMAG.2019.2908134 1 IEEE TRANSACTIONS ON MAGNETICS, v.55, no.8 IEEE TRANSACTIONS ON MAGNETICS 55 8 N scie scopus 000476800100001 2-s2.0-85069784625 Engineering, Electrical & Electronic Physics, Applied Engineering Physics Article THIN-FILMS DEPOSITION TEMPERATURE NANOPARTICLES UNDERLAYER MORPHOLOGY AG CrV/Pt/FePt multilayer FePt thin film in situ L10 ordering perpendicular magnetic recording media