Singh, Jitendra Pal Lee, Byeong hyeon Lim, Wean Cheal Shim, Cheol-Hwee Lee, Jihye Chae, Keun Hwa 2024-01-19T21:34:21Z 2024-01-19T21:34:21Z 2021-09-04 2018-10 2054-5703 https://pubs.kist.re.kr/handle/201004/120869 Zinc ferrite thin films were deposited using a radio-frequencysputtering method on glass substrates. As-deposited films were annealed at 200 degrees C for 1, 3 and 5 h, respectively. X-ray diffraction studies revealed the amorphous nature of as-grown and annealed films. Thickness of as-deposited film is 96 nm as determined from Rutherford backscattering spectroscopy which remains almost invariant with annealing. Transmission electron microscopic investigations envisaged a low degree of crystalline order in as-deposited and annealed films. Thicknesses estimated from these measurements were almost 62 nm. Roughness values of these films were almost 1-2 nm as determined from atomic force microscopy. X-ray reflectivity measurements further support the results obtained from TEM and AFM. Near-edge X-ray absorption fine structure measurements envisaged 3+ and 2+ valence states of Fe and Zn ions in these films. UV-Vis spectra of these films were characterized by a sharp absorption in the UV region. All films exhibited almost the same value of optical band gap within experimental error, whiCh is close to 2.86 eV. English ROYAL SOC Microstructure, local electronic structure and optical behaviour of zinc ferrite thin films on glass substrate Article 10.1098/rsos.181330 1 ROYAL SOCIETY OPEN SCIENCE, v.5, no.10 ROYAL SOCIETY OPEN SCIENCE 5 10 N scie scopus 000451073300068 2-s2.0-85056779797 Multidisciplinary Sciences Science & Technology - Other Topics Article MAGNETIC-PROPERTIES ABSORPTION NANOPARTICLES GROWTH thin films zinc ferrite local electronic structure optical studies