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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Jang,&#x20;Joohee</dcvalue>
<dcvalue element="contributor" qualifier="author">Yim,&#x20;Haena</dcvalue>
<dcvalue element="contributor" qualifier="author">Choi,&#x20;Ji-won</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-19T22:02:24Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-19T22:02:24Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-03</dcvalue>
<dcvalue element="date" qualifier="issued">2018-08-30</dcvalue>
<dcvalue element="identifier" qualifier="issn">0040-6090</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;121015</dcvalue>
<dcvalue element="description" qualifier="abstract">Si-doped&#x20;SnO2&#x2F;Ag&#x2F;Si-doped&#x20;SnO2&#x20;multilayer&#x20;thin&#x20;films&#x20;were&#x20;fabricated&#x20;on&#x20;flexible&#x20;substrates&#x20;at&#x20;room&#x20;temperature&#x20;for&#x20;indium&#x20;free&#x20;transparent&#x20;conducting&#x20;electrode.&#x20;The&#x20;optimal&#x20;composition&#x20;of&#x20;Si-doped&#x20;SnO2&#x20;was&#x20;found&#x20;by&#x20;investigating&#x20;electrical&#x20;properties&#x20;of&#x20;various&#x20;composition&#x20;deposited&#x20;by&#x20;off-axis&#x20;RF&#x20;magnetron&#x20;sputtering&#x20;continuous&#x20;composition&#x20;spread&#x20;method.&#x20;Si-doped&#x20;SnO2&#x20;thin&#x20;films&#x20;have&#x20;low&#x20;resistivity&#x20;(0.07&#x20;Omega.cm)&#x20;at&#x20;doping&#x20;content&#x20;of&#x20;Si&#x20;(0.14&#x20;wt%).&#x20;Si-doped&#x20;SnO2&#x2F;Ag&#x2F;Si-doped&#x20;SnO2&#x20;multilayer&#x20;thin&#x20;films&#x20;were&#x20;fabricated&#x20;using&#x20;optimized&#x20;composition&#x20;deposited&#x20;by&#x20;on-axis&#x20;RF&#x20;and&#x20;DC&#x20;sputtering.&#x20;The&#x20;optimized&#x20;Si-doped&#x20;SnO2&#x2F;Ag&#x2F;Si-doped&#x20;SnO2&#x20;multilayer&#x20;thin&#x20;film&#x20;has&#x20;resistivity&#x20;of&#x20;9.1x10(-5)&#x20;Omega.cm&#x20;and&#x20;81%&#x20;transmittance&#x20;in&#x20;the&#x20;visible&#x20;region&#x20;(550&#x20;nm).</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">ELSEVIER&#x20;SCIENCE&#x20;SA</dcvalue>
<dcvalue element="subject" qualifier="none">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">OPTICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="none">TRANSPARENT</dcvalue>
<dcvalue element="subject" qualifier="none">TIN</dcvalue>
<dcvalue element="subject" qualifier="none">SURFACES</dcvalue>
<dcvalue element="title" qualifier="none">Exploration&#x20;of&#x20;Si-doped&#x20;SnO2&#x20;composition&#x20;and&#x20;properties&#x20;of&#x20;oxide&#x2F;Ag&#x2F;oxide&#x20;multilayers&#x20;prepared&#x20;using&#x20;continuous&#x20;composition&#x20;spread&#x20;by&#x20;sputtering</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;j.tsf.2018.05.010</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">THIN&#x20;SOLID&#x20;FILMS,&#x20;v.660,&#x20;pp.606&#x20;-&#x20;612</dcvalue>
<dcvalue element="citation" qualifier="title">THIN&#x20;SOLID&#x20;FILMS</dcvalue>
<dcvalue element="citation" qualifier="volume">660</dcvalue>
<dcvalue element="citation" qualifier="startPage">606</dcvalue>
<dcvalue element="citation" qualifier="endPage">612</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000441177500082</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-85046720886</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Coatings&#x20;&amp;&#x20;Films</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Condensed&#x20;Matter</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article;&#x20;Proceedings&#x20;Paper</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">OPTICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">TRANSPARENT</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">TIN</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SURFACES</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Transparent&#x20;conducting&#x20;oxides</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Si-doped&#x20;SnO2&#x2F;Ag&#x2F;Si-doped&#x20;SnO2</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Thin&#x20;films</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Electrical&#x20;properties</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Optical&#x20;properties</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Radio-frequency&#x20;magnetron&#x20;sputtering</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Continuous&#x20;composition&#x20;spread</dcvalue>
</dublin_core>
