<?xml version="1.0" encoding="utf-8" standalone="no"?>
<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Jang,&#x20;Dong&#x20;Young</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Manjin</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Jun&#x20;Woo</dcvalue>
<dcvalue element="contributor" qualifier="author">Bae,&#x20;Kiho</dcvalue>
<dcvalue element="contributor" qualifier="author">Son,&#x20;Ji-won</dcvalue>
<dcvalue element="contributor" qualifier="author">Schlupp,&#x20;Meike&#x20;V.&#x20;F.</dcvalue>
<dcvalue element="contributor" qualifier="author">Shim,&#x20;Joon&#x20;Hyung</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T02:02:09Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T02:02:09Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-04</dcvalue>
<dcvalue element="date" qualifier="issued">2017-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">0013-4651</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;122983</dcvalue>
<dcvalue element="description" qualifier="abstract">In&#x20;this&#x20;study,&#x20;we&#x20;have&#x20;successfully&#x20;fabricated&#x20;yttria-stabilized&#x20;zirconia&#x20;(YSZ)&#x20;electrolyte&#x20;thin&#x20;films&#x20;by&#x20;aerosol-assisted&#x20;chemical&#x20;vapor&#x20;deposition&#x20;(AACVD)&#x20;for&#x20;solid&#x20;oxide&#x20;fuel&#x20;cells&#x20;(SOFCs)&#x20;working&#x20;at&#x20;an&#x20;intermediate&#x20;temperature&#x20;range&#x20;under&#x20;600.&#x20;degrees&#x20;C.&#x20;The&#x20;mix&#x20;ratio&#x20;of&#x20;precursor&#x20;sources&#x20;and&#x20;the&#x20;deposition&#x20;temperature&#x20;of&#x20;the&#x20;AACVD&#x20;process&#x20;are&#x20;optimized&#x20;to&#x20;obtain&#x20;target&#x20;composition&#x20;and&#x20;crystal&#x20;structure&#x20;of&#x20;the&#x20;YSZ&#x20;film.&#x20;The&#x20;optimized&#x20;AACVD&#x20;YSZ&#x20;membrane&#x20;is&#x20;incorporated&#x20;onto&#x20;Ni-YSZ&#x20;anodes&#x20;supported&#x20;without&#x20;interlayers&#x20;for&#x20;evaluation&#x20;of&#x20;SOFC&#x20;performance.&#x20;Fully&#x20;dense&#x20;1-mu&#x20;m-thick&#x20;AACVD&#x20;YSZ&#x20;electrolyte&#x20;successfully&#x20;produces&#x20;a&#x20;stable&#x20;open&#x20;circuit&#x20;voltage&#x20;(OCV)&#x20;greater&#x20;than&#x20;1&#x20;V&#x20;at&#x20;all&#x20;test&#x20;temperatures&#x20;in&#x20;the&#x20;range&#x20;of&#x20;450-&#x20;600.&#x20;degrees&#x20;C.&#x20;Power&#x20;output&#x20;of&#x20;the&#x20;test&#x20;cell&#x20;is&#x20;measured&#x20;as&#x20;about&#x20;600&#x20;mW&#x20;cm(-2)&#x20;at&#x20;600.&#x20;degrees&#x20;C.&#x20;Performance&#x20;of&#x20;our&#x20;cell&#x20;is&#x20;compared&#x20;to&#x20;that&#x20;of&#x20;a&#x20;reference&#x20;cell&#x20;with&#x20;the&#x20;same&#x20;structure&#x20;but&#x20;with&#x20;an&#x20;8-mu&#x20;m-thick&#x20;membrane&#x20;produced&#x20;by&#x20;screen-printing;&#x20;our&#x20;cell&#x20;produces&#x20;1.4&#x20;to&#x20;4&#x20;times&#x20;as&#x20;much&#x20;power&#x20;as&#x20;the&#x20;reference&#x20;cell&#x20;at&#x20;all&#x20;test&#x20;temperatures.&#x20;Electrochemical&#x20;impedance&#x20;analysis&#x20;has&#x20;confirmed&#x20;that&#x20;the&#x20;power&#x20;enhancement&#x20;with&#x20;the&#x20;thin&#x20;AACVD&#x20;YSZ&#x20;membrane&#x20;is&#x20;due&#x20;to&#x20;effective&#x20;reduction&#x20;of&#x20;both&#x20;ohmic&#x20;and&#x20;polarization&#x20;resistances.&#x20;(C)&#x20;2017&#x20;The&#x20;Electrochemical&#x20;Society.&#x20;All&#x20;rights&#x20;reserved.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">ELECTROCHEMICAL&#x20;SOC&#x20;INC</dcvalue>
<dcvalue element="subject" qualifier="none">LOW-TEMPERATURE&#x20;PERFORMANCE</dcvalue>
<dcvalue element="subject" qualifier="none">ATOMIC&#x20;LAYER&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="none">PULSED-LASER&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="none">ELECTROLYTE</dcvalue>
<dcvalue element="subject" qualifier="none">CONDUCTIVITY</dcvalue>
<dcvalue element="subject" qualifier="none">FABRICATION</dcvalue>
<dcvalue element="subject" qualifier="none">MICROSTRUCTURE</dcvalue>
<dcvalue element="subject" qualifier="none">IMPACT</dcvalue>
<dcvalue element="subject" qualifier="none">SOFC</dcvalue>
<dcvalue element="subject" qualifier="none">YSZ</dcvalue>
<dcvalue element="title" qualifier="none">High&#x20;Performance&#x20;Anode-Supported&#x20;Solid&#x20;Oxide&#x20;Fuel&#x20;Cells&#x20;with&#x20;Thin&#x20;Film&#x20;Yttria-Stabilized&#x20;Zirconia&#x20;Membrane&#x20;Prepared&#x20;by&#x20;Aerosol-Assisted&#x20;Chemical&#x20;Vapor&#x20;Deposition</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1149&#x2F;2.0181706jes</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;THE&#x20;ELECTROCHEMICAL&#x20;SOCIETY,&#x20;v.164,&#x20;no.6,&#x20;pp.F484&#x20;-&#x20;F490</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;THE&#x20;ELECTROCHEMICAL&#x20;SOCIETY</dcvalue>
<dcvalue element="citation" qualifier="volume">164</dcvalue>
<dcvalue element="citation" qualifier="number">6</dcvalue>
<dcvalue element="citation" qualifier="startPage">F484</dcvalue>
<dcvalue element="citation" qualifier="endPage">F490</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000401607500047</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-85027891264</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Electrochemistry</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Coatings&#x20;&amp;&#x20;Films</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Electrochemistry</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">LOW-TEMPERATURE&#x20;PERFORMANCE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ATOMIC&#x20;LAYER&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">PULSED-LASER&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELECTROLYTE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CONDUCTIVITY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FABRICATION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">MICROSTRUCTURE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">IMPACT</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SOFC</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">YSZ</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">AACVD</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">SOFC</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Thin&#x20;Film</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">YSZ</dcvalue>
</dublin_core>
