Liu, Jin Davanco, Marcelo I. Sapienza, Luca Konthasinghe, Kumarasiri De Miranda Cardoso, Jose Vinicius Song, Jin Dong Badolato, Antonio Srinivasan, Kartik 2024-01-20T02:30:20Z 2024-01-20T02:30:20Z 2021-09-01 2017-02 0034-6748 https://pubs.kist.re.kr/handle/201004/123136 We report a photoluminescence imaging system for locating single quantum emitters with respect to alignment features. Samples are interrogated in a 4 K closed-cycle cryostat by a high numerical aperture (NA= 0.9, 100x magnification) objective that sits within the cryostat, enabling high efficiency collection of emitted photons without image distortions due to the cryostat windows. The locations of single InAs/GaAs quantum dots within a >50 mu m x 50 mu m field of view are determined with approximate to 4.5 nm uncertainty (one standard deviation) in a 1 s long acquisition. The uncertainty is determined through a combination of a maximum likelihood estimate for localizing the quantum dot emission, and a cross correlation method for determining the alignment mark center. This location technique can be an important step in the high-throughput creation of nanophotonic devices that rely upon the interaction of highly confined optical modes with single quantum emitters. Published by AIP Publishing. English AMER INST PHYSICS ELECTRON-BEAM LITHOGRAPHY LOCALIZATION ANALYSIS DOTS PHOTON GAAS Cryogenic photoluminescence imaging system for nanoscale positioning of single quantum emitters Article 10.1063/1.4976578 1 REVIEW OF SCIENTIFIC INSTRUMENTS, v.88, no.2 REVIEW OF SCIENTIFIC INSTRUMENTS 88 2 scie scopus 000395902700016 2-s2.0-85013895696 Instruments & Instrumentation Physics, Applied Instruments & Instrumentation Physics Article ELECTRON-BEAM LITHOGRAPHY LOCALIZATION ANALYSIS DOTS PHOTON GAAS nanoscale positioning single quantum dots single photon cryogenic photoluminescence