Park, Sung-Ik Kim, Seong-Il Chang, Soo Kyung Kim, Young-Hwan 2024-01-20T05:01:41Z 2024-01-20T05:01:41Z 2021-09-05 2016-02-01 0040-6090 https://pubs.kist.re.kr/handle/201004/124414 Bi-doped Y2O3 phosphor thin films were fabricated by RF magnetron sputtering and their photoluminescence (PL) emission characteristics were systematically investigated depending on substrate temperature, film thickness, and Bi3+ ion concentration. Visible PL emission via P-3(1)-> S-1(0) transition of Bi3+ ions could be observed by ultraviolet light excitation and its intensity was increased with increasing the substrate temperature and the film thickness. This is due to enhancement of the film crystallinity with increasing substrate temperature and film thickness and due to interaction volume increase with increasing the film thickness. However, PL intensity had the maximum value with Bi3+ ion concentration of 1.09 at.% owing to concentration quenching effect. These films showed high transmittance of above 95% in the visible and near-infrared region and had refractive index of 1.87 +/- 1.97 depending on the wavelength. These results show the potential of Bi-doped Y2O3 phosphor thin films not only as a spectrum converting layer but also as an antireflective coating layer in crystalline Si solar cells, considering that refractive index of the Bi-doped Y2O3 film is nearly similar to that of silicon nitride film. (C) 2016 Elsevier B.V. All rights reserved. English ELSEVIER SCIENCE SA SILICON SOLAR-CELLS OPTICAL-PROPERTIES ULTRAVIOLET-LIGHT LUMINESCENCE CONVERSION EMISSION BEHAVIOR BISMUTH Fabrication and characterization of Bi-doped Y2O3 phosphor thin films by RF magnetron sputtering Article 10.1016/j.tsf.2016.01.018 1 THIN SOLID FILMS, v.600, pp.83 - 89 THIN SOLID FILMS 600 83 89 scie scopus 000371043400014 2-s2.0-84958641439 Materials Science, Multidisciplinary Materials Science, Coatings & Films Physics, Applied Physics, Condensed Matter Materials Science Physics Article SILICON SOLAR-CELLS OPTICAL-PROPERTIES ULTRAVIOLET-LIGHT LUMINESCENCE CONVERSION EMISSION BEHAVIOR BISMUTH Bi-doped Y2O3 phosphor thin film RF magnetron sputtering Photoluminescence Transmittance Refractive index